Difference between revisions of "Electron Analysis"
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| − | 1. Singles data | + | * 1. Singles data |
| − | a) examine normalized rate vs runlet for stability (strip by strip) | + | ** [[a) examine normalized rate vs runlet for stability (strip by strip)]] |
| − | b) verify consistency between 1/3, 2/3 and 3/3 trigger (first for beam OFF runs) | + | ** [[b) verify consistency between 1/3, 2/3 and 3/3 trigger (first for beam OFF runs) ]] |
| − | c) repeat for production runs | + | ** [[c) repeat for production runs]] |
| − | 2. Event mode data | + | * 2. Event mode data |
| − | a) stability of normalized rates vs runlet (strip by strips) | + | ** [[a) stability of normalized rates vs runlet (strip by strips)]] |
| − | b) normalized tracking rates and multiplicity vs runlets | + | ** [[b) normalized tracking rates and multiplicity vs runlets]] |
| − | c) use 2/3 and 3/3 to examine strip efficiency | + | ** [[c) use 2/3 and 3/3 to examine strip efficiency]] |
| − | d) use strip efficiency to verify consistency between 1/3, 2/3 and 3/3 triggers | + | ** [[d) use strip efficiency to verify consistency between 1/3, 2/3 and 3/3 triggers]] |
| − | e) efficiency weighted rates | + | ** [[e) efficiency weighted rates]] |
| − | f) efficiency weighted rates vs Compton cross-section | + | ** [[f) efficiency weighted rates vs Compton cross-section]] |
| − | g) automated Compton edge finder | + | ** [[g) automated Compton edge finder]] |
| − | h) use tracking to confirm offsets between planes | + | ** [[h) use tracking to confirm offsets between planes]] |
| − | i) Check stability of offsets | + | ** [[i) Check stability of offsets]] |
| − | 3. Accum mode data | + | * 3. Accum mode data |
| − | a) stability of normalized rates vs runlet (strip by strip) | + | ** [[a) stability of normalized rates vs runlet (strip by strip)]] |
| − | b) efficiency weighted rates, compared to Compton cross section | + | ** [[b) efficiency weighted rates, compared to Compton cross section ]] |
| − | c) asymmetry vs runlet (strip by strip) | + | ** [[c) asymmetry vs runlet (strip by strip)]] |
| − | d) asymmetry vs actual displacement of the electron (Compton edge position) | + | ** [[d) asymmetry vs actual displacement of the electron (Compton edge position)]] |
| − | e) consistency between 1/3, 2/3 and 3/3 trigger types | + | ** [[e) consistency between 1/3, 2/3 and 3/3 trigger types]] |
| − | f) polarization vs runlet | + | ** [[f) noise subtraction and its effect on asymmetry and yield ]] |
| − | + | ** [[g) polarization vs runlet]] | |
| − | i) Compton edge by eye, pol as the single parameter | + | ** [[h) consistency between different methods of extracting polarization]] |
| − | ii) Automated Compton edge and pol as single parameter | + | *** [[i) Compton edge by eye, pol as the single parameter]] |
| − | iii) use both edge and zero crossing to determine polarization | + | *** [[ii) Automated Compton edge and pol as single parameter]] |
| − | iv) compare differential method with the integral method | + | *** [[iii) use both edge and zero crossing to determine polarization]] |
| + | *** [[iv) compare differential method with the integral method]] | ||
| − | 4. Verify consistency between Fortran and C++ analyzers for most of these items. | + | * 4. Verify consistency between Fortran and C++ analyzers for most of these items. |
Latest revision as of 12:37, 2 June 2011
Preliminary list of analysis tasks
- 1. Singles data
- 2. Event mode data
- a) stability of normalized rates vs runlet (strip by strips)
- b) normalized tracking rates and multiplicity vs runlets
- c) use 2/3 and 3/3 to examine strip efficiency
- d) use strip efficiency to verify consistency between 1/3, 2/3 and 3/3 triggers
- e) efficiency weighted rates
- f) efficiency weighted rates vs Compton cross-section
- g) automated Compton edge finder
- h) use tracking to confirm offsets between planes
- i) Check stability of offsets
- 3. Accum mode data
- a) stability of normalized rates vs runlet (strip by strip)
- b) efficiency weighted rates, compared to Compton cross section
- c) asymmetry vs runlet (strip by strip)
- d) asymmetry vs actual displacement of the electron (Compton edge position)
- e) consistency between 1/3, 2/3 and 3/3 trigger types
- f) noise subtraction and its effect on asymmetry and yield
- g) polarization vs runlet
- h) consistency between different methods of extracting polarization
- 4. Verify consistency between Fortran and C++ analyzers for most of these items.
